力丰制造科技有限公司

(展台：W3-C104）

LEEPORT TECHNOLOGY LIMITED

(Booth: W3-C104)

研讨会地点：

中国国际展览中心(新馆)

综合服务楼二层东E-207 室

 

Venue:

Room E-207, 2F, East Service Building of China International Exhibition Center (New Venue)

 

研讨会题目及简介

Seminar Topic and Brief Introduction

 

 

Metris（迈卓斯）X-Tek X光断层检测技术：展示现今高科技X光断层于高精度检测的应用，通过非摧毁性方式对检测物件进行外部及内部三维检测。

 

X-ray CT measurement by Metris X-TEK:  To demonstrate how today’s high tech X-ray CT can perform high precision measurement for entire measured parts including external and internal 3D measurement with non-destructive means. 

 

 

 

Metris（迈卓斯）iGPS及激光雷达大型检测技术：介绍利用GPS概念的新科技如何把整个车间变成数码空间，而且可以无限扩展。现场讲解航空及造船业的应用案例。

 

Large space Measurement by Metris iGPS & Laser Radar: Introducing new technology to turn the whole factory floor into a digitizing space using GPS concept with unlimited expansion.  Case study for aircraft building industry and ship building industry.

 

 

 

Metris（迈卓斯）MCA及MMD扫描器提供的便携式数码检测方案：介绍以防操作疲劳为设计原则的测量臂（配合激光扫描器及接触式探针）如何轻易进行扫描及检测以前难于扫描的表面，比如：镜面及黑色的表面。

 

Portable digitizing solution by Metris MCA & MMD Scanner– Introducing health cautious spin arm with laser scanning and touch trigger probe option, to easily scan/ measure hard to scan surfaces in the past such as mirror, black surfaces.

 

 

 

Metris（迈卓斯）光学便携式三座标检测系统：现场演示以光学便携式三座标检测系统进行扫描、点对点或者实时动态检测，协助用户通过一便携式系统在生产现场进行产品组装分析。

 

Optical handheld CMM system by Metris K Series – Introducing optical handheld CMM system to do scanning, point or even real time dynamic measurement for product assembly analysis in one easily portable system around the production site.